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US Patent Issued to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE on Sept. 1 for "Molding thickness inspection system with identified moveable illuminance sensors" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,868, issued on Sept. 1, was assigned to ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (Daejeon, South Korea). "Molding thickness in... और पढ़ें


US Patent Issued to Samsung SDI on Sept. 1 for "Clearance measuring apparatus" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,869, issued on Sept. 1, was assigned to Samsung SDI Co. Ltd. (Yongin-si, South Korea). "Clearance measuring apparatus" was invented by Heet... और पढ़ें


US Patent Issued on Sept. 1 for "Shape measurement device and shape measurement method" (Japanese, Jamaican Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,870, issued on Sept. 1. "Shape measurement device and shape measurement method" was invented by Yoshito Hashimura (Amagasaki-shi, Jamaica),... और पढ़ें


US Patent Issued to RIBER on Sept. 1 for "Instrument and method for measuring the curvature and reflectivity of a surface of a sample" (French Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,871, issued on Sept. 1, was assigned to RIBER (Bezons, France). "Instrument and method for measuring the curvature and reflectivity of a su... और पढ़ें


US Patent Issued to Palladyne on Sept. 1 for "High resolution optical displacement measurement" (Utah Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,872, issued on Sept. 1, was assigned to Palladyne Corp. (Salt Lake City). "High resolution optical displacement measurement" was invented b... और पढ़ें


US Patent Issued to SAMSUNG ELECTRONICS on Sept. 1 for "Overlay measuring method and system, and method of manufacturing a semiconductor device using the same" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,873, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea). "Overlay measuring method and system, and ... और पढ़ें


US Patent Issued to The Regents of The University of Michigan on Sept. 1 for "Three dimensional stacked microstructures for use in gyroscopes and other devices" (Michigan Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,874, issued on Sept. 1, was assigned to The Regents of The University of Michigan (Ann Arbor, Mich.). "Three dimensional stacked microstruc... और पढ़ें


US Patent Issued to Astra Navigation on Sept. 1 for "Authenticating a device using geofencing data" (Polish, Canadian, American Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,875, issued on Sept. 1, was assigned to Astra Navigation Inc. (The Woodlands, Texas). "Authenticating a device using geofencing data" was i... और पढ़ें


US Patent Issued to NS Solutions on Sept. 1 for "Information processing device, information processing method, and program" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,876, issued on Sept. 1, was assigned to NS Solutions Corp. (Tokyo). "Information processing device, information processing method, and prog... और पढ़ें


US Patent Issued to Illinois Tool Works on Sept. 1 for "Tool based welding technique monitoring systems" (Wisconsin Inventor)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,877, issued on Sept. 1, was assigned to Illinois Tool Works Inc.. "Tool based welding technique monitoring systems" was invented by William... और पढ़ें